资讯

This past April, Akers was tasked with creating a 3D-printed model of a section of the Electron-Ion Collider (EIC), a ...
The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...