1. Select Analysis mode in the Column SetUp window. The working distance should be 12 mm, the default position. 2. Set the accelerating voltage to achieve at least 2x over-voltage, usually 20 kV. 3.

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning ... This year (2024–25) we are using 3. 4pi Analysis, Inc. engineers and sells X-ray Microanalysis and Digital Imaging ...

As with other ZEISS FE-SEMs, the FE-SEM column of ZEISS Crossbeams is based on Gemini ... Insulated Gate Bipolar Transistor (IGBT) device analysis. The analysis was performed entirely on ZEISS ...

Combine field emission SEM (FE-SEM) technology with advanced analytics ... structure your imaging and analysis routines and increase productivity. Sigma 300 delivers excellence in price and ...

The exclusive soft X-ray emission Spectrometer from JEOL enables parallel and efficient collection of extremely low-energy X-rays while offering unparalleled chemical state analysis. The IT800SHL—JEOL ...

the IT800SHL—JEOL's flagship FE SEM with sub-nm resolution—allows users to achieve amazing details of nanostructures in addition to detailed elemental analysis. This extremely adaptable and ...

The imaging and analytical performance of a field emission scanning electron microscope (FE-SEM) can be combined with the processing ... The integrated 3D EDS analysis provides a number of benefits.

Red - magnesium, blue - aluminium, green - calcium. Energy dispersive X-ray spectroscopy (EDX) is a kind of scanning electron microscopy that involves X-ray micro-analysis. The key features of this ...