Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Nanoscope II operates in contact mode and is primarily used for high-resolution imaging and surface force measurements in ...

Traditional Conductive AFM (C-AFM) seems to be moving aside to make space for a more advanced technology: ResiScope III – a new module for the Nano-Observer II AFM system. This move represents a ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Nano-Observer II is a state-of-the-art ...