Patterned wafer containing logic dies and 3D NAND memory dies, (f) X-ray ptychography, (g) THz wave-based defect inspection system, and (h) Coherent Fourier scatterometry techniques using ...
The same Redditor pointed out later under the post that this appears to be what's known as a "test wafer" used to calibrate the lithography machines that pattern the circuitry onto production wafers.
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