High Resolution TEM (HRTEM) to identify lattice spacings less than 0.15 nm Crystallographic phase analysis in Diffraction mode: Selected Area Electron Diffraction (SAD) from a minimum area of 200 nm ...

Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) are the two most common types of electron microscopy. TEM and SEM differ in how they work and what types of images they ...

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Recent developments surrounding Tempus AI Inc (TEM) have drawn attention, particularly due to the significant trades made by former House Speaker Nancy Pelosi. Her transactions involving major ...

When not in use, the STEM detector retracts and tilts to an angle of 90° out of view for standard SEM analysis. In contrast to other STEM modules in which a platinum mirror is utilized to obtain an ...

Velox Software provides high yield, reproducibility, and support for quantitative STEM and TEM material analysis. In conjunction with the Thermo Scientific Super-X and Dual-X Detector Systems, Velox ...